Developed by the NION company, the USTEM 200 is a C3 (spherical aberration of third order) and C5 corrected STEM received in 2011. It is fitted with a cold Field Emission Gun (CFEG) working from 60 keV to 200 keV. This allows to work with radiation sensitive (graphene…) material yet keeping a sub-atomic resolution, or to reach ultimate spatial resolutions with less radiation sensitive material (steels…). It is also fitted with an in house developed spectral-imaging and high speed, high sensitivity EELS detection system. Together with the good spectral resolution allowed by the FEG, it enables applications ranging from structure and chemical analysis of graphene like materials to atomically resolved electronic properties of interfaces of functional oxydes.